Feed forward testing

专利名称：Feed forward testing发明人：Robert Madge申请号：US10195250申请日：20020715公开号：US06682947B1公开日：20040127

专利附图：

摘要：A method of testing an integrated circuit. A first subset of test parameters isselected from a full set of test parameters designed to characterize given properties ofthe integrated circuit. A first subset of devices in the integrated circuit is tested with thefirst subset of test parameters, using different input levels to determine an acceptable

low input level and an acceptable high input level for the first subset of test parameterson the first subset of devices. At least a second subset of devices in the integrated circuitis tested, where the second subset of devices is greater in number than the first subset ofdevices. The test is accomplished with at least a second subset of test parameters usingthe acceptable low input level and the acceptable high input level, to determine whetherthe integrated circuit functions properly at the acceptable low input level and theacceptable high input level. The integrated circuit is selectively binned based upon thedetermination of whether the integrated circuit functions properly at the acceptable lowinput level and the acceptable high input level.

申请人：LSI LOGIC CORPORATION

代理机构：Luedeka, Neely & Graham, PC

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