专利名称：Method and apparatus for insulation testing
of insulated electrical conductors as well asfor detecting and classifying of insulationfaults
发明人：RICHTER, MARTIN, DIPL.-ING.(FH)申请号：EP91117571.9申请日：19911015公开号：EP0483593A3公开日：19930317
专利附图：
摘要：The previously known methods, which were used in practice, for insulation
testing of insulated electrical conductors which form at least one core, do not yet worksatsifactorily. A method having the following features is proposed according to theinvention: - the core is moved past at least two probes which are arranged one behind theother and in each case form capacitors having a conductor piece as the opposite pole, - inthis case, the probes are electrically charged in such a manner that, in the event ofdefects in the insulation of the core, the capacitor which is formed by the individual probeand the respective conductor piece is short-circuited by a breakdown current, - location-specific signals are in each case obtained, correlated to the feed movement of theconductor, by detecting and evaluating the breakdowns on the individual probes, - testvariables for the longitudinal extent of the insulation defects are derived by logicallylinking the location-specific signals from the individual probes. In the associated device,the probes form mutually insulated partial capacitors (11, 12, 13, 14), there being at leasttwo rollers (11, 12; 13, 14) as probes which are arranged on opposite sides of the core (1),axially offset with their rotation axes at right angles to the movement direction of thecore (1).
申请人：SIEMENS AKTIENGESELLSCHAFT
地址：WITTELSBACHERPLATZ 2; W-8000 MUENCHEN 2,Wittelsbacherplatz 2 D-80333München DE
国籍：DE
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