专利名称:Ventilation system and method of using发明人:Mu-Tsang Lin,Yu-Chih Liou,Tu-Yi Chiu,Ji-Liang
Wu,Wie-Liang Tsai
申请号:US101858申请日:20020627
公开号:US20040002299A1公开日:20040101
专利附图:
摘要:The present invention provides a ventilation system and method that operatesto remove outgassing of chemicals formed on a wafer during a wafer fabrication processto prevent contamination in a sealed wafer handling chamber. More particularly, the
present invention discloses a ventilation system having a hood body having a gas supplyconduit attached to a sealed outer side chamber of the ventilation hood such thatcontaminating particles in an interior of the hood are carried out by a purge gas flowninto the hood interior through an inlet of the hood connected to the gas supply conduitinto a facility vacuum exhaust system attached to an outlet of the hood. Preferably, thechamber is a load-lock chamber that operates to perform load lock processing on wafersand further operates to load and unload wafers to another location for furtherprocessing after using the ventilation system.
申请人:TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
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