CMOS image sensor with built in correction for col

专利名称：CMOS image sensor with built in correction

for column failure

发明人：Dongsoo Kim申请号：US13093298申请日：20110425公开号：US09055249B2公开日：20150609

专利附图：

摘要：A system for correcting a column line failure in an imager includes a pixelselection circuit configured to receive three adjacent pixel output signals, P(n−1), P(n) andP(n+1), respectively, from three adjacent column lines, (n−1)column line, ncolumn line and

(n+1)column line. The (n−1)column line is disposed left of an ncolumn line, and the(n+1)column line is disposed right of the ncolumn line. A generator for generating a bitpattern is also included for indicating a column line failure in the three adjacent columnlines. The pixel selection circuit is configured to provide a pixel output signal from one ofthe three adjacent column lines, based on the bit pattern.

申请人：Dongsoo Kim

地址：San Jose CA US

国籍：US

更多信息请下载全文后查看