METHOD, DEVICE AND SYSTEM FOR ACQUIRING ANTENNA EN

专利名称：METHOD, DEVICE AND SYSTEM FOR

ACQUIRING ANTENNA ENGINEERINGPARAMETERS

发明人：LI, Yingzhe,ZHANG, Hongzhuo,YANG, Li,HE,

Yang

申请号：EP14893419.3申请日：20140527公开号：EP3136500A1公开日：20170301

专利附图：

摘要：A method and device for obtaining an antenna engineering parameter and a

system are disclosed. The method for measuring an antenna engineering parameter mayinclude: obtaining, by a measurement device, a first image that is obtained by

photographing an antenna at a first position (101); mapping, by the measurement device,M characteristic points included in the first image into a first three-dimensional spatialcoordinate system, to obtain M three-dimensional space points that are in the first three-dimensional spatial coordinate system and that have a mapping relationship with the Mcharacteristic points (102), where a first mapping photographing direction is parallel to adirection of an axis in the first three-dimensional spatial coordinate system, and the firstmapping photographing direction is obtained by mapping a photographing direction ofphotographing the first image into the first three-dimensional spatial coordinate system;and obtaining, by the measurement device, a downtilt of the antenna according to a firstangle and/or obtaining an azimuth of the antenna according to a second angle (103). Themethod, device, and system help improve precision of an obtained antenna engineeringparameter, thereby providing a basis for improvement of reception and transmissionperformance of a signal.

申请人：Huawei Technologies Co. Ltd.

地址：Huawei Administration Building Bantian Longgang District Shenzhen,Guangdong 518129 CN

国籍：CN

代理机构：Pfenning, Meinig & Partner mbB

更多信息请下载全文后查看