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Method and arrangement for optical examination or

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专利名称:Method and arrangement for optical

examination or processing of a sample

发明人:Ralf Wolleschensky,Michael Kempe申请号:US10539491申请日:20031129公开号:US07612884B2公开日:20091103

专利附图:

摘要:A method and an arrangement for the optical examination and/or processing ofa sample comprise an element for generating an illumination light, an element arrangeddownstream of the latter for spectral splitting of the illumination light for generating

spatially separated spectral components, an element for parallelizing the splitillumination light, an element for focusing the illumination light on or in the sample,wherein the spectral components are superposed, and an element for detecting thesample light, advantageously comprising an element for generating a short-pulseillumination light, an element arranged downstream of the latter for spectral splitting ofthe illumination light for generating spatially separated spectral components with pulselengths that are greater than the pulse length of the illumination light, wherein thesespectral components are combined again in the sample.

申请人:Ralf Wolleschensky,Michael Kempe

地址:Schoeten DE,Kunitz DE

国籍:DE,DE

代理机构:Reed Smith LLP

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