DEVICE FOR CHARACTERISING ELECTRIC OR ELECTRONIC C

专利名称：DEVICE FOR CHARACTERISING ELECTRIC OR

ELECTRONIC COMPONENTS

发明人：Jean-Philippe Bourgoin,Vincent

Derycke,Laurianne Nougaret,GillesDambrine,Henri Happy

申请号：US13142007申请日：20091222

公开号：US20120092032A1公开日：20120419

专利附图：

摘要：The invention relates to an integrated device (PM) for characterising electric or

electronic components (DUT), in particular nanometric ones, comprising a substantiallyinsulating substrate (S) on which are provided four conducting pads (P, P, P, P), at leastthree resistive pads (R, R, R) connecting said pads together, and a transmission line (CPW)including a signal conductor (Cc) and at least one ground conductor (C, C), wherein: saidresistive pads are arranged so as to connect a first conducting pad to a second and afourth conducting pad, and to connect said fourth conducting pad to a third conductingpad; the signal conductor of the transmission line is connected to the first conductingpad; and the ground conductor of the transmission line is connected to the third pad.

申请人：Jean-Philippe Bourgoin,Vincent Derycke,Laurianne Nougaret,GillesDambrine,Henri Happy

地址：Voisins le Bretonneux FR,Montigny le Bretonneux FR,Cendras FR,WinglesFR,Mouvaux FR

国籍：FR,FR,FR,FR,FR

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