Method of and apparatus for the quantitative measu

专利名称：Method of and apparatus for the

quantitative measurement of paint coating

发明人：Naoki Matsuura,Seiya Shibata,Tatsuo

Fukuzaki,Akira Tanaka,Shigeo Fukuda,HirokiNishiyama,Mitsuru Tanaka

申请号：US08/576853申请日：19951222公开号：US05579362A公开日：19961126

摘要：An apparatus for and a method of measuring at least one painted layer formedon a sample to be analyzed, which sample may be, for example, a galvanized steelincluding a substrate having the painted layer formed thereon with or without an

intervention of a primer coated layer. In the practice of the invention, radiation is directedonto a surface of the painted layer so as to excite the sample. The intensity of resultantCompton scattering rays, the intensity of resultant fluorescent X-rays emitted from zinccontained in a plated zinc and the intensity of resultant fluorescent X-rays emitted fromstrontium contained in the primer coated layer are measured, and also the absorption ofthe fluorescent X-rays are taken into consideration, to provide a basis for calculation ofthe amount of paint coating forming the painted layer. In this way, the amount of primerand paint material both applied to the galvanized steel can be easily measured on a non-destructive basis.

申请人：RIGAKU INDUSTRIAL CORP.,IGETA STEEL SHEET CO., LTD.,KAWATETSUGALVANIZING CO., LTD.,TAIYO STEEL CO., LTD.,YODOGAWA STEEL WORKS, LTD.

代理机构：Birch, Stewart, Kolasch & Birch, LLP

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