Method and apparatus for improving testability of

专利名称：Method and apparatus for improving

testability of I/O driver/receivers

发明人：Kevin Laake,Navin Ghisiawan,Barry J. Arnold申请号：US10238570申请日：20020909公开号：US06986087B2公开日：20060110

专利附图：

摘要：An embodiment of this invention provides a circuit and method for improvingthe testability of I/O driver/receivers. First, two separate I/O driver/receiver pads areelectrically connected. A bit pattern generator in one of the I/O driver/receivers drives a

bit pattern through a driver to the connected pads. The bit pattern is then driventhrough the receiver of a second I/O driver/receiver to a first clocked register. Anidentical bit pattern generator in the second I/O driver/receiver then drives an identicalbit pattern into a second clocked register. A comparator compares the outputs of thesetwo registers. If the two bit patterns don't match, the comparator signals there is afunctional problem with one of the I/O driver/receivers.

申请人：Kevin Laake,Navin Ghisiawan,Barry J. Arnold

地址：Fort Collins CO US,Ft. Collins CO US,Fort Collins CO US

国籍：US,US,US

代理人：John Pessetto

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